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u-boot/test/dm
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Simon Glass e160f7d430 dm: core: Replace of_offset with accessor 
At present devices use a simple integer offset to record the device tree
node associated with the device. In preparation for supporting a live
device tree, which uses a node pointer instead, refactor existing code to
access this field through an inline function.

Signed-off-by: Simon Glass <sjg@chromium.org>
 		2017-02-08 06:12:14 -07:00
..
Kconfig test: Move the unit tests to their own menu 2015-05-21 09:16:17 -04:00
Makefile Add a power domain framework/uclass 2016-07-27 16:29:56 -06:00
adc.c sandbox: add ADC unit tests 2015-11-02 10:38:00 +09:00
blk.c dm: sandbox: mmc: Enable building MMC code for sandbox 2016-05-17 09:54:43 -06:00
bus.c dm: Convert users from dm_scan_fdt_node() to dm_scan_fdt_dev() 2016-07-27 14:15:07 -06:00
clk.c clk: convert API to match reset/mailbox style 2016-06-19 17:05:55 -06:00
cmd_dm.c CONFIG_NEEDS_MANUAL_RELOC: Fix warnings when not set 2015-12-07 08:35:23 -05:00
core.c test/dm/core.c: Make pre-reloc test use pre-reloc struct 2016-04-14 11:51:39 -06:00
eth.c dm: test: Add a new test case against dm eth codes for NULL pointer access 2015-10-29 14:05:52 -05:00
gpio.c dm: test: Add GPIO open drain tests 2016-06-03 22:14:20 -07:00
i2c.c dm: Use dm_scan_fdt_dev() directly where possible 2016-07-27 14:15:54 -06:00
led.c dm: test: Add a test for the LED uclass 2015-07-21 17:39:32 -06:00
mailbox.c mailbox: implement a sandbox test 2016-05-26 20:48:31 -06:00
mmc.c dm: mmc: test: Add tests for MMC 2016-05-17 09:54:43 -06:00
pci.c dm: test: Convert PCI tests to use the DM PCI API 2016-01-12 10:19:09 -07:00
pmic.c test: Generalize the unit test framework 2015-05-21 09:16:16 -04:00
power-domain.c Add a power domain framework/uclass 2016-07-27 16:29:56 -06:00
ram.c dm: test: Add a test for the ram uclass 2015-07-21 17:39:32 -06:00
regmap.c test: Add a test for regmap 2015-07-21 17:39:33 -06:00
regulator.c dm: pmic: Split output from function 2015-07-21 17:39:26 -06:00
remoteproc.c test: Add basic tests for remoteproc 2015-10-22 14:18:40 -04:00
reset.c reset: implement a reset test 2016-06-19 17:05:55 -06:00
rtc.c test: Generalize the unit test framework 2015-05-21 09:16:16 -04:00
sf.c test: Generalize the unit test framework 2015-05-21 09:16:16 -04:00
spi.c dm: core: Replace of_offset with accessor 2017-02-08 06:12:14 -07:00
spmi.c spmi: Add sandbox test driver 2016-04-01 17:18:12 -04:00
syscon.c dm: syscon: Allow finding devices by driver data 2016-01-24 12:07:19 +08:00
sysreset.c Rename reset to sysreset 2016-05-26 20:48:31 -06:00
test-driver.c test: Generalize the unit test framework 2015-05-21 09:16:16 -04:00
test-fdt.c dm: core: Replace of_offset with accessor 2017-02-08 06:12:14 -07:00
test-main.c test/dm: clear unit test failure count each run 2016-01-28 21:01:24 -07:00
test-uclass.c test: Generalize the unit test framework 2015-05-21 09:16:16 -04:00
timer.c sandbox: add a sandbox timer and basic test 2015-11-19 20:13:41 -07:00
usb.c dm: usb: Clean up USB after each test 2016-03-14 15:34:50 -06:00
video.c video: test: Adjust order of file closure 2016-02-06 13:57:15 +01:00